Industry news, industry trends, and applications for engineers involved in production testing of wafers, semiconductors, printed circuit boards, and subsystems.
Software minimizes handler downtimes 10/09/2008
Multitest has introduced software update for its MT9510 that’s designed to improve overall equipment effectiveness. More
Power-aware test hot at ITC, as is analog test Rick Nelson, Editor-in-Chief - 10/07/2008
Power-aware test will be the focus of a panel discussion and two technical paper sessions at this year’s International Test Conference, says program chair Nur Touba. Other hot topics include analog test, which will be addressed in an interactive talk with analog legend Bob Pease.
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Time to break away from "big iron"? By Larry Maloney, Contributing Editor - 10/01/2008
John VanNewkirk of Checksum argues that it's time for companies to start looking at lower-cost options for in-circuit test.
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Vote for the 2009 Test Engineer of the Year 10/01/2008
The six finalists work at St. Jude Medical, Ford Motor, Seagate Technology, Sanmina-SCI, Battelle Memorial Institute, and National Institute of Standards and Technology. Read all about them and then cast your ballot. The winner will designate a $10,000 donation to an engineering school.
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Playing it cool By Chris Allsup and Bill Lloyd, Synopsys - 10/01/2008
The semiconductor industry has long relied on scan ATPG tools instead of functional test to create stimulus-response patterns with very high fault coverage. But the higher-than-normal power consumption of ATPG can cause device damage or false failures.
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ROWE'S AND COLUMNS Martin Rowe, Senior Technical Editor, Test & Measurement World October 10, 2008 Will your budget shrink?
With all that's going on in the financial sector, I imagine that you'll soon experien... More
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T&M Challenges
