July 22, 2008

Do you want data or results?
Sprucing up the Camera Link spec may seem like a good idea, but the vision industry should also concentrate on developing a new approach to camera-to-PC communications. Read More

A D V E R T I S E M E N T Any code. Any surface. Any marking method. With the new DataMan® 700 handheld ID readers, Cognex offers the broadest range of image-based ID readers and code quality verifiers available anywhere! From printed barcodes to the most challenging direct marked 2D codes, DataMan readers provide total confidence. Learn more!

Rudolph flips lead-scanner assets
Just seven months after acquiring its lead-scanner assets from RVSI Inspection, inspection and metrology industry player Rudolph Technologies has sold the assets to BKM Technology Partners.
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YESTech upgrades automated PCB inspection system
The F1 Series automated optical inspection system from YESTech provides automated inspection of solder and lead defects, component presence and position, correct part, polarity, and through-hole parts on printed-circuit boards. Read More

JAI expands GigE Vision camera suite
JAI has added monochrome and color 5-Mpixel cameras with a GigE Vision interface to its three-tier C3 Camera Suite. These models join the recently announced 5-Mpixel Camera Link model in the Basic tier of the C3 line of cameras. Read More

A D V E R T I S E M E N T FREE REFERENCE GUIDE: The Ultimate Infrared Handbook for R&D Professionals The guidebook is a resource guide for using infrared in the Research and Development industry. Written by the experts at FLIR Systems, this FREE (for a limited time) 40-page handbook provides information on many elements of infrared including IR thermography, IR detectors, and how to get the most from an IO camera. Click here

FEI introduces extreme high-resolution scanning electron microscopes
The Magellan XHR SEM allows scientists and engineers to see 3-D surface images at many different angles and at resolutions below one nanometer. Read More

Starrett's vision system provides large z-axis clearance
The AV350 from Starrett is an intermediate-travel multisensor metrology instrument offering a large, square 14x14-in. x/y work area and extra z clearance at 8 in. Read More

SVS-Vistek unveils 11-Mpixel camera
SVS-Vistek has expanded its SVCam camera line with the svs11002-12, an 11-Mpixel model with 12-bit data format and a Camera Link interface. Read More

2008 Buyer's Guide now online
T&MW's 2008 Buyer's Guide contains more than 300 product and service categories, divided into five main sections with a total of 26 subsections. Each category includes hotlinked vendor names.
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Take a challenge, win a prize
Answer a challenge question correctly, and you could be eligible to win a prize.

Data-Acquisition Challenge:
Question: Which statement is true regarding the peak voltage?
Prize: TomTom ONE GPS
Sponsor: Data Translation

Oscilloscope Challenge:
Question: Which statement best describes chop and alternate modes?
Prize: TomTom ONE GPS
Sponsor: Yokogawa

Go to the Challenge Page

Industry calendar of events
Upcoming events include the International Test Conference (October) and Vision 2008 (November). For more information about these and other test-related events, visit our online calendar.