Webcast: Inject pulses into circuits and test for EMI immunity

Date: Friday, April 18, 2008 (available on demand until April 17, 2009)
Time: 2 PM Eastern Time, 11 AM Pacfic Time 
Sponsored by: Test & Measurement World

Join editors of Test & Measurement World and EMC expert, Doug Smith, to learn and discuss how to troubleshoot for EMI immunity. Here is a brief overview of what this hour-long webcast will cover:

Pulses with amplitudes of dozens of volts can couple across cables, resulting in unwanted interference that can wreak havoc on electronic systems. EMC consultant Doug Smith will present a technique for inductively coupling pulses into circuits for troubleshooting designs. Using current probes, Smith will show how to use injected pulses to test circuits before committing them to production. Using Smith's technique, engineers can easily inject dozens of volts into cables. Engineers can use this technique to troubleshoot ESD problems as well. 

Click here to learn more and register for this free Webcast.